Event announcement date · Applied Materials
Applied Materials brings VeritySEM 20 metrology to the High-NA EUV era
Applied Materials detailed VeritySEM 20, a next-generation critical-dimension SEM with wider landing-energy range, AI-driven recipe optimization and up to 20–50% throughput improvement for advanced metrology.
Why it matters
High-NA EUV needs tighter, faster pattern-control metrology; this tool targets that fab bottleneck directly.
Original announcement / source · Applied Materials ↗